Influence of substrate-induced strain on the magnetic and structural depth profile of La0.5Sr0.5CoO3 epitaxial films
Trough this experiment we’ll analyse the magnetic and structural depth profile on epitaxial thin films of La0.5Sr0.5CoO3 (LSCO). LSCO samples were grown on several substrates with different lattice parameters. Therefore, we are able to control the strain mismatch from tensile to compressive values. In addition by varying the sample thickness we study the ability of LSCO to relax the strain. By studying the transport and magnetic properties of these samples we observe a clear trend between the magnetic and metallic behaviour with the lattice mismatch. We aim to relate the magnetic and structural depth profile by polarized neutron reflectometry with the evolution of the magnetic behaviour and the lattice mismatch.
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O. J. Dura; Lopez de la Torre M. A.; SAERBECK Thomas and M. Sanchez-Perez. (2019). Influence of substrate-induced strain on the magnetic and structural depth profile of La0.5Sr0.5CoO3 epitaxial films. Institut Laue-Langevin (ILL) doi:10.5291/ILL-DATA.5-54-299
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