Origin of planar hall effect in epitaxial MnSi/Si(111) samples
Shortly after the first observation of magnetic skyrmion lattice in MnSi, it was established that emergent electrodynamics properties arising from its non-trivial topology, lead to a very efficient coupling to electrical currents through spin transfer torques. This discovery has fueled increasing scientific interest due to its potential application in future spintronics devices, and magnetic storage media. The study of magnetic skyrmions in thin samples is of extreme importance for its technological implementation. Published literature on MBE grown samples of MnSi on a Si substrate, have shown conflicting results. In part the existence of skyrmions in thin samples of MnSi has been proposed on the basis of planar Hall effect measurements. Recently we have measured the planar Hall effect in our samples, and identified a region displaying a finite Hall signal at low temperatures for magnetic fields just below the transition to the field polarized regime. Grazing incidence small angle neutron scattering would provide the missing microscopic information on the magnetic order behind this planar Hall effect signal and clarify where the skyrmion lattice is stabilized in this type of system
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The recommended format for citing this dataset in a research publication is in the following format:
CAUSER Grace; BAUER Andreas; Alfonso Chacon; CUBITT Robert and PFLEIDERER Christian. (2021). Origin of planar hall effect in epitaxial MnSi/Si(111) samples. Institut Laue-Langevin (ILL) doi:10.5291/ILL-DATA.5-54-331
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