Neutron diffraction in epitaxial antiferromagnetic oxide films for application in spintronics : effect of the thicknesses
We have demonstrated (see report 5-54-290) that we are able to measure the antiferromagnetic structure in epitaxial films of LaSrMnO3 and BaTiO3 superlattices at low temperature. (LaSrMnO3)n (BaTiO3)m. We have unpublished results on n=m=4 and n=m=3 films. To be able to confirm the relevence of our model, it is necessary to study the evolution of the structure whan we vary the values of n and m independently. We then propose to study here a n=3 and m=4 and n=4 and m=3 samples, where the coupling among layers is different, as well as the symmetry, but the structure of the layer it self is similar andthe opposite. 10 days was demonstrated to be needed in a previous measurement for each sample.
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SIMON Charles; BEAUVOIS Ketty; HIMANSHU Himanshu; MERCEY Bernard; OULADDIAF Bachir and REBOLINI Elisa. (2021). Neutron diffraction in epitaxial antiferromagnetic oxide films for application in spintronics : effect of the thicknesses. Institut Laue-Langevin (ILL) doi:10.5291/ILL-DATA.5-54-341
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