Determination of the magnetic structure in piezomagnetic Mn3SnN thin films using neutron diffraction
The family of manganese antiperovskites with the formula Mn3AN have recently attracted much attention due to the range of interesting properties they display, such as barocaloric and Invar effects, baromagnetism and temperature independent resistivity. The interplay of magnetic and elastic properties, and the constraints due to the geometric frustration of the non-collinear antiferromagnetic (AFM) structure, underlies these phenomena. We have recently experimentally determined a giant piezomagnetic effect (PME) in Mn3NiN thin films, which provides a novel method for control of magnetism via electric field in spintronics applications. However, the low AFM transition temperature (TN = 260K) means that room temperature applications are not yet possible. To overcome this we have grown thin films of Mn3SnNx, where 500K ≥ TN ≥ 600K depending on nitrogen content [8], and the PME is predicted to be 4 times larger than Mn3NiN, making it an ideal candidate for spintronics applications. The non-collinear AFM structure underlies the giant PME properties in this material. We therefore propose to use the D10 diffractometer to determine the magnetic structure.
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The recommended format for citing this dataset in a research publication is in the following format:
BOLDRIN David; BEAUVOIS Ketty; L F Cohen; JOHNSON Freya; OULADDIAF Bachir and QURESHI Navid. (2021). Determination of the magnetic structure in piezomagnetic Mn3SnN thin films using neutron diffraction. Institut Laue-Langevin (ILL) doi:10.5291/ILL-DATA.5-54-347
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