Layer Integrity in Composite Magnetoelectric Thin Film Stacks StudiedbyPolarized Neutron Reflectivity
We propose to use specular polarized neutron reflectometry (PNR) to study the structural and magnetic integrity of the ferromagnetic component in composite magnetoelectric multilayer stacks. The stacks consist of a varying number of layers of ferromagnetic NiFe2O4 and ferroelectric (K,Na)NbO3 (KNN), deposited by atomic layer deposition (ALD). The thickness of the individual layers are from 5 - 20 nm. The samples are made to study magnetoelectric coupling in composites of magnetostrictive/ferromagnetic and ferro-/piezoelectrics. This is an alternate way of producing multiferroic materials systems that can have enhanced properties compared to single-phase multiferroic materials, where either the magnetic- or electric response is too low for application. A crucial parameter in a composite system such as this is the integrity of the individual layers, both magnetically and morphologically. How are the magnetic layers ordered in relation to each other? How defined is the morphology of the interfaces between the layers? These are questions we hope to answer by this PNR-study.
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The recommended format for citing this dataset in a research publication is in the following format:
SOENSTEBY Henrik; FJELLVAG Oystein Slagtern; FROMMEN Christoph; HJOERVARSSON Bjoergvin; PALSSON Gunnar and VOROBIEV Alexei. (2018). Layer Integrity in Composite Magnetoelectric Thin Film Stacks StudiedbyPolarized Neutron Reflectivity. Institut Laue-Langevin (ILL) doi:10.5291/ILL-DATA.CRG-2507
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