10.5291/ILL-DATA.TEST-2434 - ILL Data Citation

This proposal is publicly available since 12/11/2019

Calibration samples of the SNS

Abstract is not yet public

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The recommended format for citing this dataset in a research publication is in the following format:

ANKNER John and Richard A. Campbell. (2014). Calibration samples of the SNS. Institut Laue-Langevin (ILL) doi:10.5291/ILL-DATA.TEST-2434

This data has not been cited by any articles.

Formula
- 50-mm diameter Si wafer
- 50-mm diameter SiO2 wafer
- 150 nm Ni film on 50 mm Si wafer
Consistence
polycristalline
Mass
200000
Container
these are solid crystals some of which have a deposited metal films on them

DOI > 10.5291/ILL-DATA.TEST-2434