DOI > 10.5291/ILL-DATA.TEST-3178

This proposal is publicly available since 03/12/2026

Title

Measurements of SLD and sample characterization for thin films

Abstract

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Experimental Report

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Data Citation

The recommended format for citing this dataset in a research publication is in the following format:

DEGENKOLB Skyler; NORDIN Pontus and SAERBECK Thomas. (2021). Measurements of SLD and sample characterization for thin films. Institut Laue-Langevin (ILL) doi:10.5291/ILL-DATA.TEST-3178

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Metadata

Experiment Parameters

  • Environment temperature

    Ambient

Sample Parameters

  • Formula

    • Silicon wafers with thin solid films of Nb, Ti, Cu, LiF, diamond, diamond-like carbon, deuterated polyethylene and Cytop (commercial fluoropolymer)

Institut Laue-Langevin

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